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Digital Instruments MultiMode SPM Nanoscope
Surface Metrology of samples. Allows AFM, STM and magnetic images to be taken. Typically, lateral resolution > 1 nm, height resolution >1 A. Samples must be less than 5 mm thick and 10 mm in diameter.
| Category: | Scanning Probe Microscopy (SPM) |
|---|---|
| Managed by: | Department of Chemistry, University of Oxford |
| Location: | Chemistry Research Laboratory, University Science Area |
| Facility: | Surface Analysis Facility (SAF) |
| Availability: | http://saf.chem.ox.ac.uk/booking-oxford.aspx |
| Shareability: | None |
| Access prerequisites: | Part of the Surface Analysis Facility (SAF). Facility open to other University departments (if capacity). |
| Restrictions on use: | Trained personnel only. |
| More information: | http://saf.chem.ox.ac.uk/home.aspx |