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Digital Instruments MultiMode SPM Nanoscope

Surface Metrology of samples. Allows AFM, STM and magnetic images to be taken. Typically, lateral resolution > 1 nm, height resolution >1 A. Samples must be less than 5 mm thick and 10 mm in diameter.

Category: Scanning Probe Microscopy (SPM)
Managed by: Department of Chemistry, University of Oxford
Location: Chemistry Research Laboratory, University Science Area
Facility: Surface Analysis Facility (SAF)
Availability: http://saf.chem.ox.ac.uk/booking-oxford.aspx
Shareability: None
Access prerequisites: Part of the Surface Analysis Facility (SAF). Facility open to other University departments (if capacity).
Restrictions on use: Trained personnel only.
More information: http://saf.chem.ox.ac.uk/home.aspx

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