Oxford user? Log in!
More information is available to you if you log in.

EM Facility

Category: Electron Probe Microanalysis (EPMA)
Scanning Electron Microscopy (SEM)
Transmission Electron Microscopy (TEM)
Managed by: Department of Materials, University of Oxford
Description: With its dedicated staff of research support scientists and technical support staff, the David Cockayne Centre for Electron Microscopy provides training and supports applications on the core Departmental EM equipment, with the aim to help researchers obtain the highest possible quality data from the instruments. The facilities can be broadly categorised as transmission electron microscopes, scanning electron microscopes, focussed ion beam systems and other systems. Transmission Scanning: JEOL ARM-200F, JEOL JEM-3000F FEGTEM, JEOL JEM-2100, JEOL JEM-2200MCO FEGTEM. Scanning: JEOL JSM-5510, JEOL JSM-6500F, JEOL JSM-840F, Zeiss Merlin Analytical, Zeiss Merlin - EBSD, Zeiss EVO, Focussed Ion Beam. Focussed Ion Beam: Zeiss NVision 40 FIB-SEM, Zeiss Auriga FIB-SEM, Zeiss Crossbeam 540.
More information: http://www-em.materials.ox.ac.uk/

Contact information

For more information, contact:

  • JEOL JEM-2000FX

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Heavily booked, particularly during Michaelmas Term (training).
    A resolution of 0.3 nm, an electron probe size down to 1 nm, and maximum specimen tilts of ±45 deg along both axes.
  • JEOL JEM-2010

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Heavily booked, particularly during Michaelmas Term (training).
    A resolution of 0.19 nm, an electron probe size down to 0.5 nm and a maximum specimen tilt of 10 degrees along both axes. Equipped ...
  • JEOL JEM-3000F FEGTEM

    Location:
    Holder Building, University Science Area
    Availability:
    Heavily booked, particularly during Michaelmas Term (training). Precedence will be given to users of the JEOL 2010 who can demonstrate their ability to use that machine and show that they are unable to carry out their work due to limitations of the LaB6 instrument.
    Field emission gun (FEG) TEM with a point resolution of 0.16 nm. Equipped with an Oxford Instruments energy dispersive X-ray spectrometer (EDS) with a super ...
  • JEOL JSM-5510LV

    Location:
    Holder Building, University Science Area
    Availability:
    Heavily booked, particularly during Michaelmas Term (training) and Hilary term (u/g teaching)
    Basic tungsten SEM with BSE/SE dectors and Oxford Xmax EDX system
  • JEOL JSM-6480LV

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Heavily booked, particularly during Michaelmas Term (training).
    Features Oxford Instruments INCA Energy, INCA Wave and Channel 5 EBSD on a JEOL 6480 Low Vacuum large stage SEM platform.
  • JEOL JSM-6500F

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Heavily booked, particularly during Michaelmas Term (training).
    Spatial resolution is 3 nm, and the analysis facilities include EDX, EBSD and cathodoluminescence.
  • JEOL JSM-840A

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Heavily booked, particularly during Michaelmas Term (training).
    Best resolution attainable on high contrast samples (Au on C) is 3.5 nm at 35 kV.
  • JEOL JSM-840F

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Heavily booked, particularly during Michaelmas Term (training).
    Best resolution attainable on high contrast samples (Au on C) is 1.8 nm at 35 kV.
  • JEOL JXA-8800

    Location:
    Hirsch Building, Begbroke Science Park
    For fully-quantitative microanalysis and elemental mapping. Four wave-length dispersive spectrometers detect and measure the X-rays generated by the electron beam hitting the sample. Exact detection ...
  • VG HB501

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Heavily booked, particularly during Michaelmas Term (training).
    FEG-STEM for EDX chemical analysis and elemental mapping with 1-2 nm spatial resolution.
  • Zeiss AURIGA FIB-SEM

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Heavily Booked, particularly during Michaelmas Term (training).
    Combines a high resolution SEM to the precision milling and nanofabrication abilities of a high resolution FIB. The SEM has resolutions of 1.0 nm at ...
  • Zeiss NVision 40 FIB-SEM

    Location:
    Holder Building, University Science Area
    Availability:
    Heavily Booked, particularly during Michaelmas Term (training).
    Combines a high resolution SEM to the precision milling and nanofabrication abilities of a high resolution FIB. The SEM has resolutions of 1.1 nm at ...