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Oxford Materials Characterisation Service (OMCS)

Category: Mie Scattering
Atomic Force Microscopy (AFM)
Differential Scanning Calorimetry
Differential Sedimentation
Dynamic Light Scattering
Fourier Transform Infrared (FTIR) Spectrometry
Microindentation
Nanomechanical Testing
Nanoparticle Tracking Analysis
Optical Profilometry
Physisorption
Raman Spectroscopy
Scanning Electron Microscopy (SEM)
Stylus Profilometry
Thermogravimetric Analysis (TGA)
UV-Vis-NIR Spectrometry
X-ray Diffraction (XRD)
X-ray Fluorescence (XRF) Spectroscopy
X-ray Photoelectron Spectroscopy (XPS)
Managed by: Department of Materials, University of Oxford
Description: OMCS offers a comprehensive service for the investigation of materials and materials related problems. OPTICAL MICROSCOPY: optical and electron microscopes to image and analyse samples providing morphology, micro-analysis and phase determination. SURFACE ANALYSIS: surface analysis techniques to investigate the properties of surfaces including elemental composition and chemistry together with depth profiling and imaging capabilities. X-RAY TECHNIQUES: X-ray techniques to non-destructively investigate the properties of materials, including composition, crystal structure and physical form. MOLECULAR SPECTROSCOPY: The use of the absorption, emission, or scattering of electromagnetic radiation by atoms or molecules to obtain compositional information about the material of interest and to study physical processes. THERMAL ANALYSIS: Instruments available to determine the thermal properties of materials including thermogravimetric, differential scanning calorimetry and microcalorimetry. PARTICLE SIZE ANALYSIS: A variety of equipment depending on particle size and required analysis.
More information: http://www-omcs.materials.ox.ac.uk/

Contact information

For more information, contact:

  • CPS Instruments CPS Disc Centrifuge

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Excellent - generally available.
    Ultra-high resolution, high accuracy measurement of particle size distribution. Highly poly-dispersed particles can be measured in the size range of ~2.0 nm to ~75 microns ...
  • Hitachi TM3000

    Location:
    Hirsch Building, Begbroke Science Park
    Tabletop SEM equipped with Bruker EDX
  • Horiba Scientific LabRAM ARAMIS

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Good: generally about 4 sessions in every 10 available.
  • JEOL JSTM-4200D

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Fairly heavily used - generally 3 sessions in every 10 available.
    Temperature range -143 to + 500°C. Topography imaging using Contact Mode or TappingMode. Vacuum Capable. Resolution depends on sharpness of probe tip. Samples must be ...
  • MTS Nano Indenter XP

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Good: generally about 4 sessions in every 10 available.
    To analyse mechanical properties of surfaces or thin films. Load resolution of ~10 nN; displacement resolution of ~0.01 nm. Max indentation load of 500 mN. ...
  • Malvern Mastersizer 2000E

    Location:
    Hirsch Building, Begbroke Science Park
    For the measurement of the particle size distribution of wet and dry samples: 0.02 to 2000 microns. With hydro sample dispersion unit.
  • Malvern Zetasizer Nano ZS

    Location:
    Hirsch Building, Begbroke Science Park
    Enables measurements of particles and molecules from 0.6 nm to 6 microns. Accurate measurements of zeta potential in aqueous and non-aqueous dispersions.
  • Matsuzawa SEIKI Microhardness Tester

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Good: generally about 4 sessions in every 10 available.
    Bench-top microhardness tester. Equipped with Vickers and Knoop indenters. Indentation position ~10 microns (using optical microscope and sample stage). Forces applied by a column of ...
  • Micro Materials NanoTest Platform

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Heavily booked.
    Capabilities include: surface/near-surface; mechanical properties of thin films and coatings, loads 10 μN - 500 mN; hardness; modulus; creep; depth-profiling; wear resistance; interfacial adhesion; and ...
  • Micromeritics Gemini V

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Excellent - generally available.
    Surface area and pore size analysis using the BET method (BET single or multipoint). Rapid twin tube set up. Surface Area: 0.01 m²/g and higher ...
  • NanoFocus uSurf

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Good: generally about 6 sessions in every 10 available.
    3D optical measurement system based on whitelight confocal microscopy. Measures optically complex surface structures while maintaining high vertical and lateral resolution.
  • NanoSight Nanoparticle Characterisation System

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Good: generally about 6 sessions in every 10 available.
    Highly accurate visualisation of individual nanoscale particles in suspension. Quantitative estimation of particle size and size distribution.
  • Oxford Instruments Twin-X

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Excellent - generally available.
    Bulk samples (solid or liquid); Na to U; ten position sample tray; method-embedded analysis recipes.
  • Oxford Instruments X-Strata 960

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Excellent - generally available.
    Thickness and/or composition of plating, coatings, films (Ti to U); 5 layers / 15 elements / common elements correction; composition analysis of up to 15 ...
  • PerkinElmer DTA

    Location:
    Hirsch Building, Begbroke Science Park
    Combined weight change and thermal events. RT- 1100oC
  • PerkinElmer HyperDSC

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Excellent - generally available.
    Determination of phase transitions / melting points / thermal transitions, etc. Temperature range: -170°C to 730°C; accuracy: ±0.1°C; precision: ±0.01°C. Calorimetry accuracy: < ±1%; precision: ...
  • PerkinElmer Pyris TGA

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Excellent - generally available.
    Determination of weight loss with temperature. Temperature range: subambient to 1000°C; scanning rates: 0.1°C/min - 200°C/min; temperature precision: ±2°C. Balance tare: reproducible to ±2 µg; ...
  • Thermo Scientific K Alpha

    Location:
    Hirsch Building, Begbroke Science Park
    Monochromated X-rays and ion profiling.30 micron spatial resolution.
  • VG CLAM 4

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Excellent - generally available.
    Quantitative elemental analysis from Li to U, ca. 0.1 At %. Surface analysis (10 nm). Ion pumped UHV chamber equipped with a VG nine channel ...
  • Varian Cary 5000

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Good: generally about 4 sessions in every 10 available.
    175 - 3300 nm range. Spectral bandwidth to 0.01 nm. Solid and liquid samples. Specular reflectance accessory.
  • Varian Excalibur

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Good: generally about 6 sessions in every 10 available.
    Chemical group speciation and molecular fingerprinting. Mid IR range (7,000 to 350 cm⁻¹), with DTGS detector (high scan rate). UMA 600 microscope with single point ...
  • Veeco AutoProbe

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Fairly heavily used - generally 3 sessions in every 10 available.
    High resolution surface analysis (up 100 microns x 100 microns). Force-distance analysis for local compliance (nanoindentation). Topography imaging using Contact Mode or TappingMode. Lateral resolution ...
  • Veeco DekTak 6M

    Location:
    Hirsch Building, Begbroke Science Park
    Availability:
    Excellent - generally available.
    Measures step heights on any surface, surface roughness, waviness and texture. Scan lengths to 25 mm. Stylus force down to 1 milligram. Z-height capability from ...